Abstract: Due to the uniform sampling pattern and concise trajectory generation, the raster scan has become the mainstream scan mode for atomic force microscopes (AFMs). However, the high-frequency ...
Abstract: Electromagnetic interference (EMI) can disrupt the operation and reliability of electronic devices, thus effective shielding and detection of EMI sources are crucial to mitigate these issues ...
The 430EX III-RT packs plenty of high-end features into a compact and lightweight package. However, the lack of an optical wireless master facility or stroboscopic multi-flash mode are disappointing.
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