Engineers and physicists have developed a method of measuring how strain affects thin films of silicon that could lay the foundation for faster flexible electronics. University of Wisconsin-Madison ...
This is a preview. Log in through your library . Abstract In order to reduce the amount of data collection necessary to use the Juhász-Nagy model, the STATIS three-way technique is proposed for pilot ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback